Recently, a team collaborating between LUSTER and Tsinghua University won first place in the "Single-Instance Industrial Defect Segmentation" challenge at the ECCV 2024 Industrial Quality Inspection Competition. This achievement follows LUSTER's success at the CVPR 2023 Industrial Quality Inspection Challenge, once again demonstrating the company's expertise in AI-powered industrial quality inspection on the international computer vision stage.

ECCV (European Conference on Computer Vision) is held biennially and is considered one of the "Big Three" conferences in computer vision, alongside ICCV and CVPR.

The winning method, "Single-Instance Industrial Defect Segmentation for Open Scenarios," represents LUSTER's technological innovation in the field of industrial multimodal vision large models. This approach, which uses a "segment first, verify later" technique for open-set single-instance industrial defect segmentation, is set to significantly improve the efficiency and accuracy of industrial quality inspection. Additionally, LUSTER's paper on self-supervised pre-training of models for industrial scenarios has been accepted by the conference. This recognition not only affirms LUSTER's international leadership in theoretical research and technical applications of industrial vision large models but also validates its continuous innovation in industrial vision inspection technology.

The 2nd Workshop on Industrial Vision Inspection, co-organized by Apple and the Georgia Institute of Technology, is scheduled for September 30th during ECCV 2024. LUSTER will present papers and reports, fostering academic research innovation and industrial practice exchanges. We look forward to witnessing more exciting achievements at ECCV 2024!